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Electron Backscatter Diffraction

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PISA – FEI Quanta 3D Dual Beam (SEM & FIB)

The FEI Quanta 3D FEG is a state-of-the-art Dual Beam machine combining traditional thermal emission scanning electron microscope (SEM) with focused ion beam (FIB). This combination allows the characterization of materials in 2D and 3D (tomography),…
PISA – ZEISS Ultra Plus Scanning Electron Microscope (SEM)

The Field Emission-Scanning Electron Microscope of the Zeiss Ultra Plus allows you to capture, analyze and supplement high-resolution images to get total information out of your sample. The complete detection system of the Ultra Plus combines a high…